iSTART-TEK INC.
Powering AI-Era Innovation with Smarter Memory Test & Repair Solutions
iSTART-TEK specializes in the development of EDA tools and semiconductor IP, providing in-chip memory test and repair solutions backed by comprehensive MBIST (Memory Built-In Self-Test) and MBISR (Memory Built-In Self-Repair) technologies. At this exhibition, iSTART-TEK will showcase START™ v5, UDA (User-Defined Algorithms), and MART (MBIST Algorithm Recommendation Tool), highlighting its capabilities in flexible test algorithms, AI-driven algorithm recommendations, DPPM control, and area-efficient design.
iSTART-TEK’s technologies are widely applied across automotive electronics, AI, HPC, networking, and consumer electronics. With nearly 30 patents and certifications including ISO 9001, ISO/IEC 27001, and ISO 26262 TCL1, the company supports functional safety and FMEDA requirements, helping customers improve memory test efficiency, accelerate time to market, and support ASIL certification.
Products & Services
START™ v5 (SRAM Built-in Testing And Repairing Technology)
START™ v5 is a memory testing and repair circuit development environment, offers various solutions for memory testing and repair. Key technologies such as Hard-Repair and Soft-Repair play a crucial role in improving SoCs’ yields and competitiveness.
Features:
• RTL/Netlist
• Repairing functions:
• Hard-Repair
• Soft-Repair
• Support UDA (User-Defined Algorithm)
• Support POT (Power-On Test)
• Automotive SoC’s specific functions
• HPC’s specific solutions
• Diagnosis functions
• ATE’s data analysis platform
• EZ-Debug
Applications:
• AI
• Automotive
• SSD
• Security
• Edge Computing
• Network
• High Resolution TCON
• AIoT
Interface:
• JTAG
• IEEE 1149.7
• IEEE 1687
EZ-BIST™ v2
EZ-BIST™ v2 is a custmized EDA tool that contains a variety of built-in memory testing algorithms. Through the graphical user interface (GUI), users can easily design memory circuits using suitable algorithms.
Features:
• MBIST only
• Easy to use with GUI
• Support UDA (User-Defined Algorithm)
• Support POT (Power-On Test)
• Automotive SoC’s specific functions
• Complete diagnosis functions
• ATE’s data analysis platform
• Auto-Clock Tracing
• EZ-Debug
Applications:
• IoT
• MCU
• Wireless
• Fingerprint recognition
Interface:
• JTAG
MBIST Algorithm Recommendation Tool (MART)
MART (MBIST Algorithm Recommendation Tool) is an AI-driven algorithm analysis system. It simplifies the selection of SRAM testing algorithms, enabling users to easily obtain a list of suitable algorithms based on their applications, DPPM targets, power consumption, performance, and area constraints.